Comprehensive Reliability Assessment of High Reliable Space Electronic Products Based on General Failure Rate

FU Hongyong; LIN Baojun; CHEN Fuen

doi:10.11728/cjss2007.03.250

Volume 27 Issue 3

May 2007

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FU Hongyong, LIN Baojun, CHEN Fuen. Comprehensive Reliability Assessment of High Reliable Space Electronic Products Based on General Failure Rate[J]. Chinese Journal of Space Science, 2007, 27(3): 250-252. doi: 10.11728/cjss2007.03.250

Citation:

FU Hongyong, LIN Baojun, CHEN Fuen. Comprehensive Reliability Assessment of High Reliable Space Electronic Products Based on General Failure Rate[J]. Chinese Journal of Space Science, 2007, 27(3): 250-252. doi: 10.11728/cjss2007.03.250

Citation:

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Comprehensive Reliability Assessment of High Reliable Space Electronic Products Based on General Failure Rate

doi: 10.11728/cjss2007.03.250 cstr: 32142.14.cjss2007.03.250

1.
Center for Space Science and Applied Research, Chinese Academy of Sciences, Beijing 100080
2.
The Graduate School of Chinese Academy of Sciences
3.
Academy of Opto-Electvonics, Chinese Academy of Sciences

Received Date: 1900-01-01
Rev Recd Date: 1900-01-01
Publish Date: 2007-05-15

Abstract

Abstract

According to the Bayes theorem, the comprehensive reliability assessment of high reliable electronic products in astronautics is studied theoretically and a method for the number of equivalent tasks is given, A calculation method from the tested and applied parameters of components is put forward. Finally a practical example for a certain space electronic product is presented.
- Bayes method,
- Comprehensive reliability assessment,
- Equivalent task