STUDY OF METHODS FOR PREDICTING SEU RATE IN SPACE ORBITS
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摘要: 系统分析了国外单粒子翻转率预估方法,提出了一种适合国内现状的单粒子翻转率预估方法,计算了五个典型轨道上的单粒子翻转率和轨道翻转率系数,为评价半导体器件抗单粒子效应的能力提供了依据.Abstract: The methods for predicting Single Event Upset (SEU) rate abroad were analyzed. A method was proposed suitable for domestic status for predicting SEU rate. SEU rates and orbit specific rate coefficients were calculated in five typical orbits, and a tool is provided to assess the ability of semiconductor devices against SEU.
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Key words:
- Space orbit /
- Single event upset rate /
- Proton /
- Heavy ion
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