1996—2003年大耀斑事件引起的TEC突然增强的统计分析
doi: 10.11728/cjss2005.01.20050502 cstr: 32142.14.cjss2005.01.20050502
A Statistical Analysis of SITEC Caused by Intense Solar Flares During 1996-2003
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摘要: 利用1996-2003年期间GOES卫星耀斑观测资料和国际GPS观测网的GPS-TEC资料分析x级大耀斑事件引起的电离层电子浓度总含量(TEC)的突然增强(SITEC)现象.对x射线耀斑等级、耀斑日面位置与SITEC的关系进行了分析.结果表明,两者都与SITEC现象的强弱有着一定的正相关性.在消除X射线耀斑等级、耀斑日面位置对电离层SITEC现象的影响后,进而分析了日地距离以及耀斑持续时间对电离层SITEC现象的影响.结果表明,日地距离和耀斑持续时间都是影响SITEC现象的重要参数,日地距离较近时发生的耀斑事件引起的SITEC现象较为强烈.另外,耀斑持续时间越长,SITEC现象越微弱,但是当耀斑持续时间继续延长时,SITEC现象的强弱逐渐趋于不再改变,最后在某值附近达到平衡.还对某些没有在电离层中引起明显SITEC现象的耀斑事件进行了讨论,发现了这类耀斑的一些特征.
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关键词:
- 耀斑 /
- 总电子含量(TEC) /
- 全球定位系统(GPS)
Abstract: In this paper,the SITEC phenomena is investigated which were caused by the X-class X-ray solar flares occurred from 1996 to 2003.The TEC data which obtained from a global GPS network are used to calculate the TEC increment,ΔTECf,and the variation rate increment,Δ(dTECf/dt),caused by solar flares.It is found that both ΔTECf and Δ(dTECf/dt) are closely related with the flare's maximal X-ray flux and its location on the solar disc.After eliminating the effect of the maximal X-ray fluxes and the locations on solar disc of different flares,results showed that there is a negative relationship between ΔTECf and the distance between the Earth and the Sun.The larger the distance,the smaller is the ΔTECf.Another finding is that Δ(dTECf/dt) correlates with the duration of the flare.Some characteristics of the flares which cause no obvious SITEC are also found.-
Key words:
- Solar flares /
- Total electron content (TEC) /
- Global position system (GPS)
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