Design and Realization of Charge Measurement System Based on VA32TA5
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摘要: 半导体探测器具有分辨率好、灵敏度高、线性范围宽等优点,是空间X/$\gamma$射线探测最常用的探测器.半导体探测系统对电子学系统的噪声水平和测量精度具有较严格的要求.针对半导体探测器对前端电子学的要求,构建了一个基于多通道电荷测量芯片VA32TA5的电荷测量系统,详细描述了该系统的设计原理和实现过程,并对其进行了初步测试.测试结果表明,该电荷测量系统具有噪声低和线性好的优点,适用于硅微条、碲锌镉等半导体探测器.Abstract: Semiconductor detector has lots of advantages,such as good resolution,high sensitivity and wide linear range,which make it the most widely used detector in space exploration of X/γ Ray.Semiconductor detection system has strict requirements on its electronics system's noise level and measurement accuracy.Aiming at these requirements,a new charge measurement system based on the multi-channel charge measurement chip VA32TA5 is designed.This paper gives a detailed introduction of the system's design principle and implementation procedure,and also gives the preliminary results of performance at the end.Testing results indicate that the system has low noise and good linearity and therefore can be applied to semiconductor detectors,e.g.silicon strip detector,CdZnTe detector.
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Key words:
- Semiconductor detector /
- charge measurement /
- VA32TA5 /
- System test
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