A Method of Profile Simulation Reduction for Ionogram

Huang Xin-yu; Tan Zi-xun; Su Yuan-zhi

doi:10.11728/cjss1986.03.217

Volume 6 Issue 3

Aug. 1986

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Article Navigation > Chinese Journal of Space Science > 1986 > 6(3): 217-222

Huang Xin-yu, Tan Zi-xun, Su Yuan-zhi. A Method of Profile Simulation Reduction for Ionogram[J]. Chinese Journal of Space Science, 1986, 6(3): 217-222. doi: 10.11728/cjss1986.03.217

Citation:

Huang Xin-yu, Tan Zi-xun, Su Yuan-zhi. A Method of Profile Simulation Reduction for Ionogram[J]. Chinese Journal of Space Science, 1986, 6(3): 217-222. doi: 10.11728/cjss1986.03.217

Huang Xin-yu, Tan Zi-xun, Su Yuan-zhi. A Method of Profile Simulation Reduction for Ionogram[J]. Chinese Journal of Space Science, 1986, 6(3): 217-222. doi: 10.11728/cjss1986.03.217

Citation:

Huang Xin-yu, Tan Zi-xun, Su Yuan-zhi. A Method of Profile Simulation Reduction for Ionogram[J]. Chinese Journal of Space Science, 1986, 6(3): 217-222. doi: 10.11728/cjss1986.03.217

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A Method of Profile Simulation Reduction for Ionogram

doi: 10.11728/cjss1986.03.217 cstr: 32142.14.cjss1986.03.217

Wuhan Institute of Physics, Academia Sinica

Received Date: 1984-11-23
Rev Recd Date: 1900-01-01
Publish Date: 1986-08-24

Abstract

Abstract

A method of profile simulation reduction for ionogram using one single-component trace is proposed. It can be used to determine the profiles of the ionosphere with multi-layer structures. The program of the mothod is simple and measured values required for reduction is less. It is convenient for routine profile analysis of the network of ionosphere stations.