STUDY OF METHODS FOR PREDICTING SEU RATE IN SPACE ORBITS

HE Chaohui

doi:10.11728/cjss2001.03.20010310

Volume 21 Issue 3

Aug. 2001

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Article Navigation > Chinese Journal of Space Science > 2001 > 21(3): 266-273

HE Chaohui. STUDY OF METHODS FOR PREDICTING SEU RATE IN SPACE ORBITS[J]. Chinese Journal of Space Science, 2001, 21(3): 266-273. doi: 10.11728/cjss2001.03.20010310

Citation:

HE Chaohui. STUDY OF METHODS FOR PREDICTING SEU RATE IN SPACE ORBITS[J]. Chinese Journal of Space Science, 2001, 21(3): 266-273. doi: 10.11728/cjss2001.03.20010310

HE Chaohui. STUDY OF METHODS FOR PREDICTING SEU RATE IN SPACE ORBITS[J]. Chinese Journal of Space Science, 2001, 21(3): 266-273. doi: 10.11728/cjss2001.03.20010310

Citation:

HE Chaohui. STUDY OF METHODS FOR PREDICTING SEU RATE IN SPACE ORBITS[J]. Chinese Journal of Space Science, 2001, 21(3): 266-273. doi: 10.11728/cjss2001.03.20010310

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STUDY OF METHODS FOR PREDICTING SEU RATE IN SPACE ORBITS

doi: 10.11728/cjss2001.03.20010310 cstr: 32142.14.cjss2001.03.20010310

HE Chaohui

Northwest Institute of Nuclear Technology, Xi'an 710024

Received Date: 2000-12-25
Rev Recd Date: 2001-05-10

Abstract

Abstract

The methods for predicting Single Event Upset (SEU) rate abroad were analyzed. A method was proposed suitable for domestic status for predicting SEU rate. SEU rates and orbit specific rate coefficients were calculated in five typical orbits, and a tool is provided to assess the ability of semiconductor devices against SEU.
- Space orbit,
- Single event upset rate,
- Proton,
- Heavy ion