Volume 25 Issue 1
Jan.  2005
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CHEN Bin, LIU Libo, WAN Weixing, NING Baiqi, DING Feng. A Statistical Analysis of SITEC Caused by Intense Solar Flares During 1996-2003[J]. Chinese Journal of Space Science, 2005, 25(1): 6-16. doi: 10.11728/cjss2005.01.20050502
Citation: CHEN Bin, LIU Libo, WAN Weixing, NING Baiqi, DING Feng. A Statistical Analysis of SITEC Caused by Intense Solar Flares During 1996-2003[J]. Chinese Journal of Space Science, 2005, 25(1): 6-16. doi: 10.11728/cjss2005.01.20050502

A Statistical Analysis of SITEC Caused by Intense Solar Flares During 1996-2003

doi: 10.11728/cjss2005.01.20050502 cstr: 32142.14.cjss2005.01.20050502
  • Received Date: 2004-06-15
  • Rev Recd Date: 2004-11-08
  • In this paper,the SITEC phenomena is investigated which were caused by the X-class X-ray solar flares occurred from 1996 to 2003.The TEC data which obtained from a global GPS network are used to calculate the TEC increment,ΔTECf,and the variation rate increment,Δ(dTECf/dt),caused by solar flares.It is found that both ΔTECf and Δ(dTECf/dt) are closely related with the flare's maximal X-ray flux and its location on the solar disc.After eliminating the effect of the maximal X-ray fluxes and the locations on solar disc of different flares,results showed that there is a negative relationship between ΔTECf and the distance between the Earth and the Sun.The larger the distance,the smaller is the ΔTECf.Another finding is that Δ(dTECf/dt) correlates with the duration of the flare.Some characteristics of the flares which cause no obvious SITEC are also found.

     

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